Electron Microscopy Workshop Registration Fees

Biography

Dr. Khong holds a PhD in Solid State Physics. His distinguished career spans executive leadership roles across semiconductor manufacturing, data storage technology, microprocessor assembly, and the solar energy sector, alongside extensive contributions to academia as a university professor and faculty dean. A veteran organizer, he was instrumental in the greenfield startup of two manufacturing facilities and two private universities. Prior to founding PowerSains, he served as the CEO of Tech Dome Penang, playing a pivotal role in the inception, launch, and strategic growth of the world-class science center. In recognition of his foundational contributions to STEM promotion, he was conferred the Darjah Johan Negeri (DJN) by the Penang State Government in 2018.

Dr. Yeoh Lai Seng

Catching the Invisible: The Microchip Detective's Guide to Failure Analysis 

Biography

Dr. Yeoh Lai Seng is currently a Lead Principal Engineer in the Failure Analysis Department at Infineon Technologies Memory Solutions Malaysia Sdn. Bhd., where he has been serving since 2010. As a technical lead, he manages a team of engineers supporting the memory product division, with expertise spanning Flash Memory, FRAM, RRAM, SRAM, HyperRAM, eCT memory, and SONOS memory. 

Dr. Yeoh Lai Seng is currently a Lead Principal Engineer in the Failure Analysis Department at Infineon Technologies Memory Solutions Malaysia Sdn. Bhd., where he has been serving since 2010. As a technical lead, he manages a team of engineers supporting the memory product division, with expertise spanning Flash Memory, FRAM, RRAM, SRAM, HyperRAM, eCT memory, and SONOS memory. 

He holds a Bachelor in Applied Physics from USM (2001), first Master in Solid State Physics from USM (2004), second Master in Microelectronics Engineering from MMU (2011), and a Ph.D. in Semiconductor (GaN-based MOSFET) from USM (2014). 

He holds a Bachelor in Applied Physics from USM (2001), first Master in Solid State Physics from USM (2004), second Master in Microelectronics Engineering from MMU (2011), and a Ph.D. in Semiconductor (GaN-based MOSFET) from USM (2014). 

Abstract

This presentation explores the critical field of semiconductor failure analysis (FA) and its evolution into a strategic driver of "yield maturity" in modern memory manufacturing. As memory devices shrink to nanometer dimensions, physical defects—such as micro cracks, corrosion, and metallic contaminants— become increasingly invisible to conventional inspection methods, threatening both production yield and long term reliability. Drawing on real industrial case studies from Flash memory, flip flop circuits, and advanced packaging, this session introduces cutting edge diagnostic techniques including nano probing, Electron Beam Absorbed/Induced Current (EBAC/EBIC), high resolution STEM imaging, and advanced Energy Dispersive X ray (EDX) spectroscopy. Attendees will learn how these powerful tools not only shorten analysis turnaround time from days to hours, but also uncover root causes—such as tungsten particles from CMP residues and cobalt stringers from silicidation processes—that lead to measurable yield improvements of up to 4% and >60% reduction in defect rates for automotive applications. The webinar also addresses the emerging challenges posed by 3D packaging technologies like Through Silicon Vias (TSVs) and hybrid bonding, and looks ahead at future enablers such as Plasma FIB and machine learning assisted defect classification. This session bridges fundamental semiconductor physics with industrial manufacturing reality, demonstrating why failure analysis is the unsung hero behind every reliable smartphone, computer, and automotive electronic system. 

Dr. Azdiar A. Gazder

Multiscale Analytical Microscopy

Biography

Dr. Azdiar A. Gazder is a Senior Research Fellow at the Electron Microscopy Centre (EMC), Australian Institute for Innovative Materials (AIIM), University of Wollongong, Australia, where he specialises in advanced electron microscopy and materials characterisation. He obtained his Graduate Diploma and PhD in Materials Engineering from Monash University and has since established an international reputation in microstructural characterisation, crystallography, and physical metallurgy. He played a leading role in the development of the University of Wollongong Electron Microscopy Centre, one of Australia's premier facilities for advanced microscopy research.

 
Dr. Gazder's research focuses on understanding the relationships between material processing, microstructure, and performance through advanced characterisation techniques, particularly scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), and diffraction-based analysis. His work has contributed to the development of advanced structural materials, including steels, aluminium, titanium, magnesium, and shape-memory alloys, supporting innovations in manufacturing, energy, and engineering applications.
 

An internationally recognised researcher, Dr. Gazder has authored more than 120 peer-reviewed publications, secured numerous competitive research grants, and collaborated extensively with industry and research institutions. He is a Certified Materials Professional (CMP), a Fellow of the Royal Microscopical Society (FRMS), and serves as an Executive Member of the Australian Microbeam Analysis Society (AMAS). His keynote address will provide valuable insights into the latest developments in electron microscopy and demonstrate how advanced characterisation techniques are driving innovation in materials science and engineering.